1/30/2024 | 90319090 | Electronic card used to measure optical properties of semiconductor devices (3014469: TOOL_PROBER CARD WICOP 1X3_G2HF FLIP BLA), 100% new. | XXXXXXXXXX | 2 | Pieces | 890 | South Korea | HA NOI |
1/30/2024 | 90319090 | Electronic card for measuring optical properties of electronic components (3009420:COMM Prober Card) (PS4200), part of product properties measuring machine, 100% new | XXXXXXXXXX | 5 | Pieces | 1081.8 | South Korea | HA NOI |
1/30/2024 | 90319090 | Electronic card for measuring optical properties of electronic components (3009420:COMM Prober Card) (PS4200), part of product properties measuring machine, 100% new | XXXXXXXXXX | 5 | Pieces | 1081.8 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card for measuring optical properties of electronic components (9670568:AWP_Y1414-2A_4CH_ESD (4CH, 3ONE-dia 20, 8PIN, CONNECTOR 8 , Angle 108, T/L-625um), part of sp properties measuring machine , 100% new | XXXXXXXXXX | 25 | Pieces | 4680.5 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card for measuring optical properties of electronic components (PROBE CARD AWP_S0945-EAHP_4CH_ESD(4CH, 3ONE, 8PIN)), part of product properties measuring machine, 100% new | XXXXXXXXXX | 1 | Pieces | 265.82 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card for measuring optical characteristics of electronic components 9670699:PROBE CARD ADP_Y0930-3E_4CH_ESD(4CH, 3ONE-dia 20, 8PIN, CONNECTOR 8 , Angle 108,T/L-625um)part of product characteristic measuring machine product, 100% new | XXXXXXXXXX | 5 | Pieces | 936.1 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card for measuring optical properties of electronic components (PROBE CARD AWP_S1232-ELHP_4CH_ESD (4CH, 3ONE, 8PIN)), part of product properties measuring machine, 100% new | XXXXXXXXXX | 1 | Pieces | 265.82 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card used to measure the optical properties of semiconductor components (3010865: COMM_PROBE CARD(INNO)WICOP C 1X1 3P), part of the product characterization meter. New 100% | XXXXXXXXXX | 5 | Pieces | 1582.7 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card used to measure the optical properties of semiconductor components (3011985:TOOL_WICOP-C_1X2 PROBE CARD MINI), part of the product characteristics measuring machine, 100% new | XXXXXXXXXX | 6 | Pieces | 3480 | South Korea | HA NOI |
1/26/2024 | 90319090 | Electronic card for measuring optical properties of electronic components PROBE CARD AWP_S0942-RD_4CH_ESD(4CH, 3ONE, 8PIN)), part of product properties measuring machine, 100% new | XXXXXXXXXX | 1 | Pieces | 265.82 | South Korea | HA NOI |