8/15/2023 | 3818009000 | INGAN/GAN TEST PLATES WITH HETEROEPITAXYL STRUCTURE, INTENDED FOR THE PRODUCTION OF DETECTORS FOR ELECTRON MICROSCOPES AND MASS SPECTROMETER | XXXXXXXXXX | 0 | 0 | 35468.55 | Israel | REHOVOT |
7/31/2023 | 3818009000 | INGAN/GAN TEST PLATES WITH HETEROEPITAXYL STRUCTURE, INTENDED FOR THE PRODUCTION OF DETECTORS FOR ELECTRON MICROSCOPES AND MASS SPECTROMETER | XXXXXXXXXX | 0 | 0 | 109134 | Israel | REHOVOT |
4/7/2023 | 3818009000 | INGAN/GAN TEST PLATES WITH HETEROEPITAXYL STRUCTURE, INTENDED FOR THE PRODUCTION OF DETECTORS FOR ELECTRON MICROSCOPES AND MASS SPECTROMETER | XXXXXXXXXX | 0 | 0 | 80121.88 | Israel | REHOVOT |