11/30/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 5000 | NA | 822.79 | SINGAPORE | N/A |
11/30/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 15000 | NA | 321.93 | SINGAPORE | N/A |
11/30/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 6000 | NA | 2017.16 | SINGAPORE | N/A |
11/30/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 3000 | NA | 3715.76 | Netherland | N/A |
11/29/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 1280 | NA | 945.52 | Hong Kong | N/A |
11/29/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 3000 | NA | 370.38 | Netherland | N/A |
11/29/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 2500 | NA | 2182.29 | Netherland | N/A |
11/28/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 3000 | NA | 1312.33 | Netherland | N/A |
11/27/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 8500 | NA | 1862.94 | CHINA | N/A |
11/25/2023 | 85423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 6000 | NA | 1955.19 | SINGAPORE | N/A |