| 3/30/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 13500 | N/A | 6041 | SINGAPORE | N/A |
| 3/28/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 3000 | N/A | 891 | SINGAPORE | N/A |
| 3/26/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 147 | N/A | 26048.7 | Netherland | N/A |
| 3/26/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 9000 | N/A | 2532 | SINGAPORE | N/A |
| 3/26/2024 | 085423900000 | 220.00 PE INTEGRATED CIRCUIT TESTING | XXXXXXXXXX | 220 | N/A | 88 | THAILAND | N/A |
| 3/25/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 63105 | N/A | 62428.3 | MALAYSIA | N/A |
| 3/25/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 29000 | N/A | 18544 | SINGAPORE | N/A |
| 3/23/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 100 | N/A | 166 | USA | N/A |
| 3/23/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 5940 | N/A | 6563.4 | Netherland | N/A |
| 3/22/2024 | 085423900000 | INTEGRATED CIRCUIT ELECTRONIC PARTS FOR WAFER PROBE AND TESTING ASSEMBLY UNITS | XXXXXXXXXX | 15000 | N/A | 9493 | USA | N/A |