3/8/2024 | 90312000 | HYSITRON INTRASPECT 90 BASE SYSTEM (LAB. INSTRUMENT FOR RESEARCH PURPOSE) | XXXXXXXXXX | 1 | NOS | 123057.93 | USA | KOLKATA AIR |
12/27/2023 | 90312000 | ELDRO ELHY TEST BENCH COMPLETE ,INCLUSIVE OF TOOLS(BRAKE PARTS)(DTL AS PER INVOICE) 90 | XXXXXXXXXX | 1 | NOS | 30046.57 | GERMANY | KOLKATA AIR |
12/23/2023 | 90312000 | CPU WRITING FIXTURE VJ-412-321 (FOR TESTING AC PCB) (CAPTIVEUSE) 90 | XXXXXXXXXX | 2 | PCS | 6072.58 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | INCIRCUIT TESTER VB3B4ICT0103 (FOR TESTING AC PCB) (CAPTIVEUSE) 90 | XXXXXXXXXX | 1 | PCS | 5688.32 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | CPU WRITING UNIT VB412WR0105 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 4956.55 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION UNIT VB412FCT0205 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 8549.25 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION UNIT VB412FCT0204 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 9830.82 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | INSULATION/ WITHSTANDING TESTER VJ-3B4-313 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 3217.96 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION UNIT VB3B4FCT0104 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 6427.3 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION TESTER VJ-3B4-353 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 4465.84 | JAPAN | DELHI ACC |