12/23/2023 | 90312000 | CPU WRITING FIXTURE VJ-412-321 (FOR TESTING AC PCB) (CAPTIVEUSE) 90 | XXXXXXXXXX | 2 | PCS | 6072.58 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | INCIRCUIT TESTER VB3B4ICT0103 (FOR TESTING AC PCB) (CAPTIVEUSE) 90 | XXXXXXXXXX | 1 | PCS | 5688.32 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | CPU WRITING UNIT VB412WR0105 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 4956.55 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION UNIT VB412FCT0205 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 8549.25 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION UNIT VB412FCT0204 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 9830.82 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | INSULATION/ WITHSTANDING TESTER VJ-3B4-313 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 3217.96 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION UNIT VB3B4FCT0104 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 6427.3 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | FUNCTION TESTER VJ-3B4-353 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 4465.84 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | INSULATION/ WITHSTANDING TESTER VJ-412-313 (FOR TESTING AC PCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 1 | PCS | 3249.84 | JAPAN | DELHI ACC |
12/23/2023 | 90312000 | LAPTOP FOR CPU WRITING FIXTURE LATIUDE 3520 (FOR TESTING ACPCB) (CAPTIVE USE) 90 | XXXXXXXXXX | 2 | PCS | 1932.33 | JAPAN | DELHI ACC |