3/29/2024 | 90129000 | SPARE PARTS, SDD DETECTOR L-HT (212-25470-43) | XXXXXXXXXX | 1 | PCS | 24508.01 | JAPAN | HYDERABAD AIR |
3/21/2024 | 90121090 | HITACHI TABLETOP MICROSCOPE MODEL TM4000PLUS II (MA) AS PERSTANDARD ACCESSORIES | XXXXXXXXXX | 1 | SET | 52489.46 | JAPAN | HYDERABAD AIR |
1/29/2024 | 90129000 | FE EMITTER AND ATTACHMENTS FOR JEM-F200 (CF-HR) FIELD EMISSION TRANSMISSION ELECTRON MICROSCOPE USD | XXXXXXXXXX | 1 | SET | 10120.34 | JAPAN | HYDERABAD AIR |
12/22/2023 | 90129000 | 820470082 PLATE (PARTS FOR JEM-SERIES ELECTRON ELECTRON MICROSCOPE) 90 | XXXXXXXXXX | 10 | NOS | 95.92 | JAPAN | DELHI ACC |
12/22/2023 | 90129000 | 780197534 EMITTER ASSEMBLY SM-EXG65 (PARTS FOR JSM-7800F SCANNING ELECTRON MICROSC SCANNING MICROSCOPE) 90 | XXXXXXXXXX | 1 | NOS | 6714.66 | JAPAN | DELHI ACC |
11/28/2023 | 90129000 | LAB6 EMITTER (DENKA/MITS) 9432 909 96101 (FOC) | XXXXXXXXXX | 1 | PCS | 1096.3 | JAPAN | SAHAR AIR CARGO ACC |
11/27/2023 | 90129000 | 781008018 ELEMENT (PARTS FOR JAMP-SERIES AUGER MICROPROBE) | XXXXXXXXXX | 10 | NOS | 323.46 | JAPAN | DELHI AIR CARGO ACC |
11/27/2023 | 90129000 | 821362224 OL MOVABLE APERTURE (MOLYBDENUM PLATE) (PARTS FOR JAMP-SERIES AUGER MICROPROBE) | XXXXXXXXXX | 10 | NOS | 1078.21 | JAPAN | DELHI AIR CARGO ACC |
11/22/2023 | 90129000 | RETRACTABLE BE DETECTOR SM-84034SRBEW (ATTACHMENTS FOR JSM-IT800 FIELD EMISSIONG SCANNING ELECTRON MICROSCOPE) | XXXXXXXXXX | 1 | SET | 14854 | JAPAN | HYDERABAD ACC |
11/20/2023 | 90129000 | PARTS FOR JEM ARM300F2 WDELECTRON MICROSCOPE.STD SPECIMEN RD-EM24GAN211.DETAILS AS PER INVOICE.FOC. | XXXXXXXXXX | 1 | PCS | 2444.45 | JAPAN | KOLKATA ACC |