3/30/2024 | 38180090 | SEMICONDUCTOR WAFER (PROCESSED) SAMPLE: GA2O3 WITH ACCESSORIES (FOR RESEARCH USE ONLY) P.O.NO. 4300004932 | XXXXXXXXXX | 1 | SET | 4383.38 | JAPAN | BANGALORE AIR |
3/29/2024 | 38180090 | FOC WAFERS (QTY= 10 NOS) (FOR R&D PURPOSE ONLY) | XXXXXXXXXX | 2.7 | KGS | 122.54 | USA | BANGALORE AIR |
3/28/2024 | 38180090 | 735221-1EA FLUORINE DOPED TIN OXIDE COATED GLASS S (1000MG) | XXXXXXXXXX | 3 | NOS | 139.76 | USA | BANGALORE AIR |
3/27/2024 | 38180090 | ZSC31150GAB ASIC DIE (COMPENENT USED FOR PRESSURE TRANSMITE) | XXXXXXXXXX | 28232 | NOS | 43910.22 | GERMANY | BANGALORE AIR |
3/25/2024 | 38180090 | 735140-5EA FLUORINE DOPED TIN OXIDE COATED GLASS S& (FOR LABPURPOSE) | XXXXXXXXXX | 7 | NOS | 373.61 | USA | BANGALORE AIR |
3/23/2024 | 38180090 | S045071-100MM SOI WAFERS (FOR RESEARCH USE ONLY) P.O.NO. 4300004682 | XXXXXXXXXX | 10 | PCS | 3491.92 | USA | BANGALORE AIR |
3/23/2024 | 38180090 | GLASS / WAFER [ FOR RESEARCH USE ONLY ] ( P.O. NO. 4300004728) | XXXXXXXXXX | 5 | NOS | 3794.62 | CHINA | BANGALORE AIR |
3/19/2024 | 38180090 | GAP PAD (MS34.30-47-100) (THERMAL INTERFACE) 1723137-4 | XXXXXXXXXX | 200 | NOS | 5070.28 | USA | BANGALORE AIR |
3/16/2024 | 38180090 | 735221-1EA FLUORINE DOPED TIN OXIDE COATED GLASS S& (FOR LABPURPOSE) | XXXXXXXXXX | 2 | NOS | 98.04 | USA | BANGALORE AIR |
3/16/2024 | 38180090 | 735167-1EA FLUORINE DOPED TIN OXIDE COATED GLASS S (FOR LABPURPOSE) | XXXXXXXXXX | 60 | NOS | 3343.74 | USA | BANGALORE AIR |