3/5/2024 | 90308200 | MEASURE SEMICONDUCTOR WAFERS,DEVICES 195996162-10626431007 P188900390 CHARGE-PC3B992B 6645136A TEST BOARD | XXXXXXXXXX | 1 | PCS | 27258.07 | CHINA | BANGALORE AIR |
3/2/2024 | 90308200 | MEASURE SEMICONDUCTOR WAFERS DEVICES-PROBE CARD ETS NLR/NLR | XXXXXXXXXX | 1 | NOS | 23595.84 | CHINA | BANGALORE AIR |
1/18/2024 | 90308200 | 10-77-03023-GEN4 TESTING BOARD FOR FPGACARD PCIE ADAPTER GEN4 TESTING BOARDS WITH ACCESSOREIS FG FOR RELAY CONPCS | XXXXXXXXXX | 3 | PCS | 634.3 | CHINA | BANGALORE AIR |
1/9/2024 | 90308200 | PROBE CARD ETS INST/APPAR FOR MEAS SC WAFER DICE CHIPS SL NO.6644524ANOS | XXXXXXXXXX | 1 | NOS | 11553.4 | CHINA | BANGALORE AIR |
11/14/2023 | 90308200 | MEASURE SEMICONDUCTOR WAFERS DEVICES-3B992B 6644890A-195877814-10 P188900390 DIBETS BOARD | XXXXXXXXXX | 1 | NOS | 1897.44 | CHINA | BANGALORE ACC |
11/14/2023 | 90308200 | PROBE CARD ISO776XX 8 6645501A TYPE 2.5MSP(PROBE CARD)WITH HEAD COVER MC501CDR6SL NO.XTK2300146 | XXXXXXXXXX | 1 | SET | 13990.63 | CHINA | BANGALORE ACC |
11/14/2023 | 90308200 | ISO776X X8 664501A TYPE 2.5MSP 00020 PROBE HEAD SPACE TRANSFORMER STEEL TOP(PROBE CARD)WITH HEAD COVER MC01CDR6 S/N.STK2 | XXXXXXXXXX | 1 | SET | 13990.63 | CHINA | BANGALORE ACC |
10/20/2023 | 90308200 | PCA0-005420-00 PROBE CARD TPS281C100 X8DEVELOPMENT BOARD TIA00 00010145 SL NO.US-059987-0 | XXXXXXXXXX | 1 | NOS | 12086.99 | CHINA | BANGALORE ACC |
10/20/2023 | 90308200 | PCA0-005420-00 PROBE CARD TPS281C100 X8DEVELOPMENT BOARD TIA00 00010144 SL NO.US-059989-0 | XXXXXXXXXX | 1 | NOS | 12086.99 | CHINA | BANGALORE ACC |
10/10/2023 | 90308200 | MEASURE SEMICONDUCTOR WAFERS DEVICES CHARGE-PC 3B992B 6645102A DIBE ETS BOARD | XXXXXXXXXX | 1 | NOS | 2427.01 | CHINA | BANGALORE ACC |